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Manufacturing intelligence for reducing false alarm of defect classification by integrating similarity matching approach in CMOS image sensor manufacturing.
Ying-Jen Chen
Chu-Yuan Fan
Kuo-Hao Chang
Published in:
Comput. Ind. Eng. (2016)
Keyphrases
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similarity matching
false alarms
defect classification
detection rate
retrieval method
image retrieval
image processing
multimedia
data structure
target detection