Yield Model for Fault Clusters Within Integrated Circuits.

Charles H. Stapper

Published in: IBM J. Res. Dev. (1984)

Keyphrases

integrated circuit
computational model
formal model
statistical model
probabilistic model
theoretical analysis
information retrieval
theoretical framework
input data
hidden markov models
cost function
objective function
probability distribution
pairwise
hierarchical structure
clustering algorithm
neural network