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ESD event simulation automation using automatic extraction of the relevant portion of a full chip.
Thorsten Weyl
Dave Clarke
Karl Rinne
James A. Power
Published in:
ISQED (2009)
Keyphrases
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automatic extraction
relation extraction
low cost
high speed
natural language text
simulation model
single chip
closely related
term extraction
wrapper generation
mathematical model
high density
simulation models
event driven
event recognition
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