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Performance analysis of CNFET based circuits in the presence of fabrication imperfections.

Malgorzata Chrzanowska-JeskeRehman AshrafRajeev K. NainSiva G. Narendra
Published in: ISCAS (2012)
Keyphrases
  • three dimensional
  • high speed
  • high density
  • image sequences
  • integrated circuit
  • database
  • information retrieval
  • clustering algorithm
  • data structure
  • infrared