Automatic Test Pattern Generation and Compaction for Deep Neural Networks.
Dina MoussaMichael HefenbrockChristopher MünchMehdi B. TahooriPublished in: ASP-DAC (2023)
Keyphrases
- neural network
- pattern recognition
- multi layer
- data mining
- real time
- artificial neural networks
- back propagation
- fully automatic
- neural network model
- deep learning
- competitive learning
- rule extraction
- learning rules
- network architecture
- feed forward
- semi automatic
- data driven
- image segmentation
- information systems
- computer vision