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Hot carrier degradation behavior in SOI dynamic-threshold-voltage nMOSFET's (n-DTMOSFET) measured by gated-diode configuration.
Ru Huang
Jinyan Wang
Jin He
Min Yu
Xing Zhang
Yangyuan Wang
Published in:
Microelectron. Reliab. (2003)
Keyphrases
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dynamic behavior
transmission line
dynamic environments
social networks
high speed
computer simulation
power system
real time