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Random Positional Deviations Correction for Each LED via ePIE in Fourier Ptychographic Microscopy.
Sining Chen
Tingfa Xu
Jizhou Zhang
Xing Wang
Yizhou Zhang
Published in:
IEEE Access (2018)
Keyphrases
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image analysis
fourier transform
image stacks
frequency domain
data sets
real time
fourier spectrum
multiscale
video sequences
lower bound
computer vision
multiresolution
image reconstruction
image enhancement
high throughput
learning algorithm
radon transform
uniformly distributed
electron microscopy