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Comparison of Radiation Hardness of Stacked Transmission-Gate Flip Flop and Stacked Tristate-Inverter Flip Flop in a 65 nm Thin BOX FDSOI Process.
Mitsunori Ebara
Kodai Yamada
Jun Furuta
Kazutoshi Kobayashi
Published in:
IOLTS (2019)
Keyphrases
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flip flops
multiple input
cmos technology
infrared
neural network
pattern recognition
image analysis
low cost
medical images
data flow