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The Impact of Pulsed Electromagnetic Fault Injection on True Random Number Generators.

Maxime MadauMichel AgoyanJosep BalaschMilos GrujicPatrick HaddadPhilippe MaurineVladimir RozicDave SingeléeBohan YangIngrid Verbauwhede
Published in: FDTC (2018)
Keyphrases
  • fault injection
  • random number generators
  • java card
  • random number
  • fault model
  • random numbers
  • smart card
  • static analysis