SyRA: Early System Reliability Analysis for Cross-Layer Soft Errors Resilience in Memory Arrays of Microprocessor Systems.
Alessandro ValleroAlessandro SavinoAthanasios ChatzidimitriouManolis KaliorakisMaha KooliMarc RieraMarti AngladaGiorgio Di NataleAlberto BosioRamon CanalAntonio GonzálezDimitris GizopoulosRiccardo MarianiStefano Di CarloPublished in: IEEE Trans. Computers (2019)