A 350μW Sign-Bit architecture for multi-parameter estimation during OFDM acquisition in 65nm CMOS.
Isael DiazSiyu TanYun MiaoLeif R. WilhelmssonOve EdforsViktor ÖwallPublished in: ISCAS (2015)
Keyphrases
- parameter estimation
- nm technology
- cmos technology
- power consumption
- maximum likelihood
- model selection
- least squares
- analog to digital converter
- markov random field
- low power
- em algorithm
- statistical models
- parameter estimation algorithm
- random fields
- expectation maximization
- parameter values
- estimation problems
- parameters estimation
- random access memory
- analog vlsi
- approximate inference
- model fitting
- design considerations
- ofdm system
- remote sensing
- image processing
- image sensor