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Interconnect coupling-aware driver modeling in static noise analysis for nanometer circuits.
Xiaoliang Bai
Rajit Chandra
Sujit Dey
P. V. Srinivas
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2004)
Keyphrases
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high speed
quantitative analysis
statistical modeling
random noise
computer vision
website
data analysis
image restoration
missing data