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SIMPL-2: (SIMulated Profiles from the Layout-Version 2).

K. LeeAndrew R. Neureuther
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1988)
Keyphrases
  • simulation model
  • data sets
  • databases
  • real world
  • object recognition
  • multiresolution
  • special case
  • test bed
  • graph layout