Login / Signup
Low-Loss I/O Pad With ESD Protection for K/Ka-Bands Applications in the Nanoscale CMOS Process.
Bo-Wei Peng
Chun-Yu Lin
Published in:
IEEE Trans. Circuits Syst. II Express Briefs (2018)
Keyphrases
</>
input output
information security
data structure
atomic force microscopy
data sets
databases
case study
main memory
hyperspectral images
high levels
ibm zenterprise