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A Partitioning Technique for Identification of Error-Capturing Scan Cells in Scan-BIST.

Chaowen YuSudhakar M. ReddyIrith Pomeranz
Published in: IOLTS (2006)
Keyphrases
  • database
  • error bounds
  • automatic identification
  • real time
  • databases
  • three dimensional
  • database systems
  • similarity measure
  • artificial neural networks
  • hidden markov models
  • error rate
  • scan path