Resonant Gain Scheduling Controller for Spiral Scanning Patterns in Atomic Force Microscopy.
Matheus Senna de OliveiraAurelio Tergolina SaltonJeferson Vieira FloresGuilherme Araujo PimentelPublished in: ICIRA (2) (2018)
Keyphrases
- atomic force microscopy
- closed loop
- real time
- control system
- scheduling problem
- pattern mining
- data sets
- round robin
- resource constraints
- dynamic programming
- response time
- control method
- evolutionary algorithm
- image processing
- particle swarm optimization
- frequent patterns
- resource allocation
- scheduling algorithm
- control strategy
- interesting patterns
- scan data
- data mining