EPIC: Efficient prediction of IC manufacturing hotspots with a unified meta-classification formulation.
Duo DingBei YuJoydeep GhoshDavid Z. PanPublished in: CoRR (2014)
Keyphrases
- classification accuracy
- classification systems
- prediction accuracy
- neural networks and support vector machines
- feature selection
- pattern recognition
- support vector machine svm
- feature extraction
- automatic classification
- pattern classification
- svm classifier
- text classification
- nearest neighbour algorithm
- classification method
- cross validation
- class labels
- data sets
- image classification
- feature vectors
- decision trees
- supervised learning
- support vector machine
- machine learning methods
- artificial neural networks
- manufacturing systems
- support vector
- predictive modeling
- machine learning
- neural network