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Testing Logic-Intensive Memory ICs on Memory Testers.

Robert WuJerry GernerRichard WheelusKevin Lew
Published in: IEEE Des. Test Comput. (1997)
Keyphrases
  • test cases
  • memory usage
  • computing power
  • real world
  • memory requirements
  • machine learning
  • memory footprint
  • random access memory
  • genetic algorithm
  • high speed
  • modal logic
  • memory capacity