Taming Noise in Deep Submicron Digital Integrated Circuits (Panel).

N. S. Nagaraj Kenneth L. Shepard Takahide Inone

Published in: DAC (1998)

Keyphrases

integrated circuit
electron beam
random noise
noisy data
signal to noise ratio
image noise
noise level
metal oxide semiconductor
additive noise
data sets
image structure
estimation error
efficient implementation
missing data
signal processing
low cost
printed circuit boards
digital libraries