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All from One, One for All, Failure Diagnosis of Discrete Event Systems Using Representatives.

Yannick Pencolé
Published in: ICTAI (2003)
Keyphrases
  • diagnosis of discrete event systems
  • knowledge base
  • bayesian networks
  • response time
  • failure prediction
  • database
  • data sets
  • databases
  • data mining
  • feature selection
  • artificial neural networks
  • failure modes