Iddq testing for CMOS VLSI.

Rochit Rajsuman

Published in: Proc. IEEE (2000)

Keyphrases

high speed
vlsi circuits
single chip
power consumption
power dissipation
low cost
low power
focal plane
correlation analysis
chip design
image processing
circuit design
signal processing
imaging systems
power supply
clustering algorithm
vlsi design
analog vlsi
neural network
data sets