Login / Signup

Parameter Extraction for Statistical IC Process Characterization.

Costas J. SpanosStephen W. Director
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1986)
Keyphrases
  • information extraction
  • data driven
  • real time
  • artificial intelligence
  • data structure
  • search algorithm
  • preprocessing
  • process model