A process control approach to cyber attack detection.
Nong YeJoseph GiordanoJohn FeldmanPublished in: Commun. ACM (2001)
Keyphrases
- process control
- attack detection
- cyber security
- cyber attacks
- multistage
- intrusion detection system
- control system
- intrusion detection
- product quality
- semiconductor manufacturing
- manufacturing process
- anomaly detection
- network security
- smart grid
- attack scenarios
- product recommendation
- security issues
- control charts
- computer networks
- social networks
- data mining
- real time