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New concepts of worst-case delay and yield estimation in asynchronous VLSI circuits.

Miljana SokolovicVanco B. LitovskiMark Zwolinski
Published in: Microelectron. Reliab. (2009)
Keyphrases
  • vlsi circuits
  • worst case
  • low power
  • upper bound
  • power dissipation
  • lower bound
  • average case
  • np hard
  • markov random field
  • power consumption
  • case study