28 nm 50% Power-Reducing Contacted Mask Read Only Memory Macro With 0.72-ns Read Access Time Using 2T Pair Bitcell and Dynamic Column Source Bias Control Technique.
Yukiko UmemotoKoji NiiJiro IshikawaMakoto YabuuchiKazuyoshi OkamotoYasumasa TsukamotoShinji TanakaKoji TanakaTetsuya MatsumuraKazutaka MoriKazumasa YanagisawaPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2014)