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28 nm 50% Power-Reducing Contacted Mask Read Only Memory Macro With 0.72-ns Read Access Time Using 2T Pair Bitcell and Dynamic Column Source Bias Control Technique.

Yukiko UmemotoKoji NiiJiro IshikawaMakoto YabuuchiKazuyoshi OkamotoYasumasa TsukamotoShinji TanakaKoji TanakaTetsuya MatsumuraKazutaka MoriKazumasa Yanagisawa
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2014)
Keyphrases
  • read write
  • random access
  • hard disk
  • write operations
  • computational power
  • access control
  • x ray