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Broadband Dielectric Measurements on Highly Scattering Materials.
Zijing Li
A. Sharma
A. I. M. Ayala
Mohammed N. Afsar
Konstantin A. Korolev
Published in:
IEEE Trans. Instrum. Meas. (2010)
Keyphrases
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multiple scattering
surface roughness
rough surfaces
three dimensional
neural network
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materials science