Pattern Classification Based on a Piecewise Multi-linear Model for the Class Probability Densities.
Edgard NyssenLuc Van KempenHichem SahliPublished in: SSPR/SPR (2000)
Keyphrases
- linear model
- pattern classification
- parzen window
- probability density
- least squares
- regression model
- feature extraction
- pattern recognition
- discriminant embedding
- density estimation
- density ratio
- nonlinear models
- probability density function
- gaussian mixture model
- random variables
- maximum likelihood estimation
- class labels
- probability distribution
- high dimensional
- neural network
- semi parametric