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XRD Patterns and Bismuth Sticking Coefficient in Thin Films Fabricated by Ion Beam Sputtering Method.
Seung-Ho Yang
Yong-Pil Park
Published in:
J. Inform. and Commun. Convergence Engineering (2006)
Keyphrases
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objective function
thin film
similarity measure
support vector machine
single image
grain size
data mining techniques
detection method
shape from shading
multi layer
magnetic field