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Backside nanotexturing protected by thin silicon layer for high bending strength ICs.

Chia-Liang HsuKunal KashyapAmarendra KumarJ. Andrew YehMax T. Hou
Published in: NEMS (2016)
Keyphrases
  • silicon dioxide
  • real time
  • machine learning
  • computer vision
  • case study
  • three dimensional
  • database systems
  • expert systems