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Effects of burn-in stressing on post-irradiation annealing response of power VDMOSFETs.
Snezana Djoric-Veljkovic
Ivica Manic
Vojkan Davidovic
Snezana Golubovic
Ninoslav Stojadinovic
Published in:
Microelectron. Reliab. (2003)
Keyphrases
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power consumption
simulated annealing
neural network
machine learning
search engine
probabilistic model
information retrieval
social networks
case study
database systems
video sequences
relational databases
long term
negative effects