Suppressing test inflation in shared-memory parallel Automatic Test Pattern Generation.
Jerry C. Y. KuRyan H.-M. HuangLouis Y.-Z. LinCharles H.-P. WenPublished in: ASP-DAC (2014)
Keyphrases
- shared memory
- distributed memory
- message passing
- parallel algorithm
- parallel programming
- parallel computing
- multi processor
- parallel architecture
- parallel computation
- parallel machines
- parallel architectures
- parallel computers
- message passing interface
- data parallelism
- address space
- shared memory multiprocessor
- parallel execution
- shared memory multiprocessors
- multi core systems
- higher order
- belief propagation
- commodity hardware
- cloud computing
- graph cuts
- heterogeneous platforms
- markov random field