Modeling transistor level masking of soft errors in combinational circuits.

Ihsen Alouani Smaïl Niar Yassin El Hillali Atika Rivenq-Menhaj

Published in: EWDTS (2015)

Keyphrases

high speed
database
data mining
integrated circuit
image processing
higher level
prediction error
information loss
modeling language
error analysis
digital circuits
asynchronous circuits
electronic circuits