Efficient Convolutional Neural Networks for Semiconductor Wafer Bin Map Classification.
EunMi ShinChang D. YooPublished in: Sensors (2023)
Keyphrases
- convolutional neural networks
- semiconductor manufacturing
- classification accuracy
- image classification
- decision trees
- feature extraction
- classification method
- support vector machine svm
- text classification
- feature selection
- classification systems
- automatic classification
- pattern classification
- feature vectors
- support vector machine
- pattern recognition
- support vector
- wafer fabrication
- maximum likelihood
- unsupervised learning
- computationally efficient
- supervised learning
- class labels
- machine learning methods
- feature space
- integrated circuit
- neural network