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Testing methods for detecting stuck-open power switches in coarse-grain MTCMOS designs.

Szu-Pang MuYi-Ming WangHao-Yu YangMango Chia-Tso ChaoShi-Hao ChenChih-Mou TsengTsung-Ying Tsai
Published in: ICCAD (2010)
Keyphrases
  • coarse grain
  • fine grain
  • database
  • fine grained
  • wireless networks
  • power consumption