Semiconductor Defect Detection by Hybrid Classical-Quantum Deep Learning.
YuanFu YangMin SunPublished in: CoRR (2022)
Keyphrases
- deep learning
- defect detection
- quantum computation
- unsupervised learning
- machine learning
- unsupervised feature learning
- restricted boltzmann machine
- feature extraction
- mental models
- deep architectures
- probabilistic model
- object recognition
- viewpoint
- object detection
- decision support system
- image segmentation
- weakly supervised
- decision making
- computer vision
- deep belief networks
- learning algorithm
- data sets