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Research on Equivalent Reliability for Press Pack IGBT in Hybrid HVDC Circuit Breaker.

Mengyue HuYangchun ChengJinyuan LiPeng WangHeli Meng
Published in: EEET (2018)
Keyphrases
  • high speed
  • circuit design
  • simulation software
  • long term
  • hybrid approaches
  • e learning
  • failure rate
  • analog vlsi