A radiation hardened 512 kbit SRAM in 180 nm CMOS technology.

Cristiano Calligaro Valentino Liberali Alberto Stabile

Published in: ICECS (2009)

Keyphrases

cmos technology
low power
power consumption
low voltage
x ray
spl times
parallel processing
low cost
embedded dram
silicon on insulator
mixed signal
high speed
image sensor
power dissipation
leakage current
power management
digital signal processing
digital images