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The Investigation of Negative Capacitance Vertical Nanowire FETs Based on SPICE Model at Device-Circuit Level.
Weixing Huang
Huilong Zhu
Kunpeng Jia
Zhenhua Wu
Xiaogen Yin
Qiang Huo
Yongkui Zhang
Published in:
CoRR (2020)
Keyphrases
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computational model
statistical model
formal model
high level
probabilistic model
high speed
data sets
neural network
objective function
genetic algorithm
decision making
probability distribution
higher level