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Testing Scheme for CMOS Integrated Circuits.

Chun-Lung HsuMean-Hom HoChin-Feng Lin
Published in: IEEE Trans. Instrum. Meas. (2009)
Keyphrases
  • integrated circuit
  • high speed
  • low cost
  • metal oxide semiconductor
  • control system
  • power consumption
  • embedded systems
  • low power
  • printed circuit boards
  • vlsi circuits