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Erratum to: A Small Chip Area Stochastic Calibration for TDC Using Ring Oscillator.

Kentaroh KatohYutaro KobayashiTakeshi ChujoJunshan WangEnsi LiCongbing LiHaruo Kobayashi
Published in: J. Electron. Test. (2015)
Keyphrases
  • high speed
  • programmable logic
  • small number
  • low cost
  • bayesian networks
  • dynamical systems
  • small size
  • camera network
  • intrinsic parameters
  • single chip
  • physical design