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Impact of Process-Induced Inclined Sidewalls On Small Signal Parameters of Silicon Nanowire GAA MOSFET.

Ashraf ManiyarP. S. T. N. SrinivasPramod Kumar Tiwari
Published in: TENCON (2023)
Keyphrases
  • signal processing
  • expectation maximization
  • sensitivity analysis
  • measured data
  • artificial neural networks
  • parameter estimation
  • low power