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Single-event transient effects on dynamic comparator in 28 nm FDSOI CMOS technology.
Nilson Maciel
Elaine Crespo Marques
Lirida A. B. Naviner
Hao Cai
Published in:
Microelectron. Reliab. (2018)
Keyphrases
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cmos technology
low power
power consumption
spl times
low voltage
parallel processing
power dissipation
image sensor
silicon on insulator
image processing
low cost
mixed signal