TPLan-A Notation for Expressing Test Purposes.

Stephan Schulz Anthony Wiles Steve Randall

Published in: TestCom/FATES (2007)

Keyphrases

support vector
three dimensional
control system
artificial neural networks
preprocessing
statistical significance
modeling language
test cases
knowledge representation
special case
evolutionary algorithm
learning algorithm
digital libraries
data structure
high level
image processing
e learning