Login / Signup

FEMSIM + HRMC: Simulation of and structural refinement using fluctuation electron microscopy for amorphous materials.

Jason J. MaldonisJinwoo HwangPaul M. Voyles
Published in: Comput. Phys. Commun. (2017)
Keyphrases
  • electron microscopy
  • thin film
  • low energy
  • x ray
  • image stacks
  • structural information
  • learning materials
  • simulation environment
  • neural network
  • mathematical model
  • simulation model
  • microscopy images