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Efficient Full-Chip Yield Analysis Methodology for OPC-Corrected VLSI Designs.
Valery Axelrad
Nicolas B. Cobb
M. O'Brien
Thuy Do
Tom Donnelly
Yuri Granik
Emile Y. Sahouria
Victor Boksha
Artur Balasinski
Published in:
ISQED (2000)
Keyphrases
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high speed
low cost
real time
neural network
signal processing
statistical analysis
high density
machine learning
decision trees
image sequences
infrared
cost effective
quantitative analysis
complexity analysis