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Analog fault detectability based on statistical circuit analysis.

Dimitrios K. PapakostasV. C. KosmidisAlkiviades A. Hatzopoulos
Published in: ICECS (1996)
Keyphrases
  • statistical analysis
  • real world
  • information systems
  • information theoretic
  • image analysis
  • high speed
  • infrared
  • fault diagnosis
  • statistical methods
  • correlation analysis