Login / Signup

Bayesian Analysis of Hazard Rate, Change Point, and Cost-Optimal Burn-In Time for Electronic Devices.

Tao YuanYue Kuo
Published in: IEEE Trans. Reliab. (2010)
Keyphrases
  • bayesian analysis
  • electronic devices
  • change point
  • hazard rate
  • computationally feasible
  • change point detection
  • optimal solution
  • smart phones
  • data structure
  • dynamic programming
  • text mining