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Novel Micro Scanning with Integrated Atomic Force Microscope and Confocal Laser Scanning Microscope.

Meng-Hao ChouChing-Chi HuangYi-Lin LiuHuang-Chih ChenLi-Chen Fu
Published in: CCTA (2019)
Keyphrases
  • laser scanning
  • visual inspection
  • volume reconstruction
  • three dimensional
  • high resolution
  • microscopy images
  • image analysis
  • image processing
  • super resolution
  • single image
  • specular surfaces