Sign in

Compact and behavioral modeling of transistors from NVNA measurements: New flows and future trends.

David E. RootJianjun XuFranz SischkaMihai MarcuJason HornR. M. BiernackiMasaya Iwamoto
Published in: CICC (2012)
Keyphrases
  • future trends
  • open issues
  • mobile communications
  • data mining
  • case study
  • data analysis
  • high density
  • genetic algorithm
  • learning algorithm
  • decision making
  • modeling method
  • circuit design
  • recent trends
  • behavioral model