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Analysis and prevention of DRAM latch-up during power-on.

Young-Hee KimJae-Yoon SimHong June ParkJae-Ik DohKun-Woo ParkHyun-Woong ChungJong-Hoon OhChoon-Sik OhSeung-Han Ahn
Published in: IEEE J. Solid State Circuits (1997)
Keyphrases
  • power consumption
  • databases
  • data analysis
  • high density
  • data mining
  • case study
  • image analysis
  • nearest neighbor
  • statistical analysis